ATP5034/5030制冷型高分辨率光纤光谱仪技术参数：
|
Type |
Linear array detector |
|
Detectable range |
200-1100 nm |
|
Effective pixel |
2048 or 4096 pixels |
|
Sensor Cooled |
TEC cooled, -5 ˚C |
|
Pixel dimension |
14μm × 200μm |
|
Sensitivity |
1300 V/(lx·s) |
|
Dark noise |
13 RMS @ 13 ˚C |
|
Optical Parameter |
|
|
Wavelength range |
200-1100 nm |
|
Optical resolution |
0.07-3 nm |
|
Signal-to-noise |
>600:1 |
|
Dynamic range |
8.5 x 107 (system); 2000:1 for a single acquisition |
|
Stray light |
<0.05% at 600 nm; <0.09% at 435 nm |
|
Working temperature |
-25-50 oC |
|
Working humidity |
< 90%RH |
|
Optical Configuration |
|
|
Optical Design |
Czerny-Turner |
|
Focal Distance |
75mm |
|
Incidence slit |
50 μm (10, 25, 100 um are optional) |
|
Incident Interface |
SMA905 connector |
|
Electrical Parameter |
|
|
Integration time |
0.1 ms - 256 second |
|
Interfaces |
USB Type-C |
|
A/D conversion resolution |
16 bit |
|
Supply voltage |
DC4.5 to 5.5 V (type @5V) |
|
Operating current |
170mA@Typ. |
|
Storage temperature |
-30°C to +70°C |
|
Operating temperature |
-25-50 oC |
|
Physics Parameter |
|
|
Dimension |
150 × 90 × 37.5 mm |
|
weight |
0.5kg |
|
Sealing |
Anti-sweat |
价格，货期，样本 ATP5034/5030制冷型高分辨率光纤光谱仪 技术参数或有任何疑问，请联系客服。
