KSPB Semiconductor Strain Gages The KSPB series gages are stable-performance semiconductor strain gages usable for general stress measurement and transducers. The F2 type has a half-bridge formed with a 2-element structure (Positive and Negative), for self-temperature compensation and is suitable for strain measurement of steel products. Inquiry about purchase View details in the General Catalog Main Specifications Line Up Related Product Major Properties Materials Resistive element 1-element: P type Si 2-element: P type Si and N type Si (2-element structure) Materials Base Polyimide Operating temperature in combination with major adhesives after curing (°C) CC-33A: -50 to 120ºC EP-340: -50 to 150ºC Operating temperature in combination with major leadwire cables (°C) - Self-temperature-compensation (°C) 1-element: - 2-element: 20 to 50 Applicable linear expansion coefficients (×10-6/℃) 1-element: - 2-element: 11 Strain limits at normal temp. (approx. %) 1-element: 0.3 2-element: 0.15 Fatigue lives at normal temp. (times) 2 x 106 (±1000 μm/m)